Diagnostics of Malfunctions in Electronic Apparatus

New methods of active diagnostics are considered for detection and registration of malfunctions of apparatus - computer facilities, sensors, actuators, optical and electronic complexes. A set of informative indications is suggested for detection and registration of malfunction sources connectors, contacting units of LSI and VLSI, contact wires of printed circuits (including multi-layer ones), interface buses, unshielded solid and stranded conductors, earth and power buses, terminal blocks, soldering sites. Results of malfunction investigation with application of physical models of the apparatus element base, taking into account electromagnetic compatibility, are presented.