Method for Calculating the Particle Projection Area in Two-Dimensional Nanoscale Images using the Threshold Algorithms

Abstract

The growing complexity of studying nanoscale images and meshing the results of experiments processing makes it necessary to automate this process to improve accuracy and reliability of the results obtained. As part of the ongoing research, a method was developed to determine automatically the particles area in the electron microscope images. The threshold algorithm and its modification was considered to identify particles in the nanoscale images. Block matching and 3D filtering algorithm was selected for preprocessing. The optimal sequence of the above algorithms for images application was obtained in order to solve the problem. Several threshold algorithms and methods for calculating the corresponding threshold values were considered forming the base to select the most appropriate algorithms in the context of the problem being solved. The above method resulted in determining dependence of the particles number on their area for each given image. Currently, quite large and constantly growing volumes of nanoscale images were accumulated, which leads to a need to automate the research process. The proposed method is intended to solve practical problems in determining the particles area in the nanoscale images and could be used at various stages of the experiment

Please cite this article in English as:

Baydin G.S., Titov A.S. Method for calculating the particle projection area in two-dimensional nanoscale images using the Threshold algorithms. Herald of the Bauman Moscow State Technical University, Series Instrument Engineering, 2022, no. 4 (141), pp. 4--19 (in Russ.). DOI: https://doi.org/10.18698/0236-3933-2022-4-4-19

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