MainCatalogInstrument Engineering, Metrology, Information-Measuring Instruments and SystemsElectronic Component Base of Micro- and Nanoelectronics, Quantum Devices
Electrical Erosion of the Contact Coatings Based on the High-Melting Point Metal Alloys
Authors: Gololobov G.P., Kruglov S.A., Suvorov D.V., Slivkin E.V., Gudzev V.V. | Published: 22.03.2024 |
Published in issue: #1(146)/2024 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Electronic Component Base of Micro- and Nanoelectronics, Quantum Devices | |
Keywords: contact coating, high-melting point metal alloys, electrodeposition, surface micro-relief, contact resistance, switching tests, electrical erosion |
Prospects of using the Schottky-Barrier Composite Two-Tier FETs in a HIC of the Microwave Power Amplifiers
Increasing the Dynamic Accuracy of a Gyroscope with Internal Elastic Gimbal in the Angular Rate Sensor Mode
Authors: Podchezertsev V.P., Nguyen D.D. | Published: 28.12.2021 |
Published in issue: #4(137)/2021 | |
DOI: 10.18698/0236-3933-2021-4-188-207 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Navigation Instruments | |
Keywords: orientation and navigation systems, gyroscope, inner elastic gimbal, dynamic accuracy, angular rate sensor |