MainCatalogInstrument Engineering, Metrology, Information-Measuring Instruments and SystemsInstruments and Measuring Methods
VLSI Circuit Detection Through Tangled Logic Structures
Authors: Kuzovlev V.I., Ivanova N.A. | Published: 12.08.2016 |
Published in issue: #4(109)/2016 | |
DOI: 10.18698/0236-3933-2016-4-4-18 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: very-large-scale integration (VLSI), tangled logic structures (TLS), functional circuit analysis |
Тhickness Distribution Measurement of Multilayer Film Structures by Spectral Reflectometry Methods
Authors: Tsepulin V.G., Tolstoguzov V.L., Karasik V.Ye., Perchik A.V., Arefev A.P. | Published: 15.06.2016 |
Published in issue: #3(108)/2016 | |
DOI: 10.18698/0236-3933-2016-3-3-12 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: multilayer film structures, reflectometry, profilometry, acousto-optical filter, thin films |
On the possibility of complete rough surface of asperities crumpling for an elastoplastic body
Authors: Murashov M.V., Panin S.D. | Published: 08.04.2016 |
Published in issue: #2(107)/2016 | |
DOI: 10.18698/0236-3933-2016-2-79-90 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: contact, roughness, finite element method, elastic-plastic deformation, ANSYS |
Computation of pressure sensor membrane
Authors: Tinyakov Yu.N., Nikolaeva A.S. | Published: 23.12.2015 |
Published in issue: #6(105)/2015 | |
DOI: 10.18698/0236-3933-2015-6-135-142 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: pressure sensor, elastic membrane, plate |
Study Stocksic and Antistocksic Components of Laser Device’s Signal for Controlling of Drinking Water Parameters
Authors: Tomilin V.I., Moguilnaya T.Yu. | Published: 14.04.2015 |
Published in issue: #2(101)/2015 | |
DOI: 10.18698/0236-3933-2015-2-83-91 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: devices for liquid content control, SBS-spectroscopy, resonance methods |
Instruments and methods of measurement laser method for vegetation monitoring
Authors: Belov M.L., Bullo O.A., Fedotov Yu.V., Gorodnichev V.A. | Published: 14.04.2015 |
Published in issue: #2(101)/2015 | |
DOI: 10.18698/0236-3933-2015-2-71-82 | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: laser method, fluorescence, vegetation, detection of stress conditions |
Optimal space-time signal processing effected by narrow band stationary correlated Gaussian interference
Authors: Gelesev A.I. | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Influence of acoustic-optical processor errors on accuracy of digital processing of wide-band signals
Authors: Odinokov S.B., Borisov M.V., Martyanov А.N., Novikov A.A. | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Filtration of interferences during analog-to-digital conversion
Authors: Kalinin А.V. | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |
Threshold of signal detection at parametric spectral estimation
Authors: Soloviev A.G.  | Published: 04.04.2015 |
Published in issue: #4(37)/1999 | |
DOI: | |
Category: Instrument Engineering, Metrology, Information-Measuring Instruments and Systems | Chapter: Instruments and Measuring Methods | |
Keywords: |